Souifi, Abdelkader K.

Top Publications

Top Publications Authored or Co-Authored by "Souifi, Abdelkader K."

• Study of trapping phenomenon in 4H-SiC MESFETs: Dependence on substrate purity

  IEEE Transactions on Electron Devices, Volume 50, No. 2, Year 2003, Citations 48
• Effect of interface traps for ultra-thin high-k gate dielectric based MIS devices on the capacitance-voltage characteristics

  Microelectronics Reliability, Volume 75, Year 2017, Citations 27
• Effect of annealing time on the performance of tin oxide thin films ultraviolet photodetectors

  Thin Solid Films, Volume 623, Year 2017, Citations 26
• Traps centers and deep defects contribution in current instabilities for AlGaN/GaN HEMT's on silicon and sapphire substrates

  Microelectronics Journal, Volume 37, No. 4, Year 2006, Citations 25
• Analysis of photogenerated random telegraph signal in single electron detector (photo-SET)

  Optics Express, Volume 18, No. 1, Year 2010, Citations 21