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Publication Details
AFRICAN RESEARCH NEXUS
SHINING A SPOTLIGHT ON AFRICAN RESEARCH
physics and astronomy
Cavities and dislocations induced in silicon by MeV He implantation
Journal of Applied Physics, Volume 87, No. 5, Year 2000
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Description
We implanted n-type silicon with 1.6 MeV helium at fluences ranging from 1 × 1016 to 1 × 1017 He/cm2 while keeping a constant dose rate. These samples were then subjected to 800°C annealing for 30 min. The results obtained by means of cross-sectional transmission electron microscopy indicate that the density of cavities is fluence dependent with homogeneous distribution of cavity sizes when fluences of 5 × 1016 and 1017 He/cm2 are used. The threshold fluence required to form cavities is found to be between 1 and 2 × 1016 He/cm2. For the 2 × 1016 He/cm2 dose, we observed loop punching induced by a concerted action of overpressurized bubbles, whereas He implants at doses of 5×1016 and 1×1017/cm2 lead to the formation of {311} defects. At the same time, non-Rutherford elastic backscattering (NREBS) experiments using 2.5 MeV H+ provide the fraction of helium remaining in cavities after different annealing times at 800°C. The NREBS data show a fast He release process for short annealing times (< 2000 s). Then, the He amount decreases slowly and after 30000 s about 40% of the helium still remain in cavities. Finally, an additional implantation with 50 keV He at 5 × 1016 He/cm2 shows the difference in cavity size distribution between MeV and keV implantation. © 2000 American Institute of Physics.
Authors & Co-Authors
Godey, S.
France, Paris
Centre de Recherches Internationales Sciences po
Sauvage, Thierry
France, Paris
Centre de Recherches Internationales Sciences po
Ntsoenzok, Esidor
France, Paris
Centre de Recherches Internationales Sciences po
Erramli, Hassane
Morocco, Marakech
Faculté Des Sciences Semlalia
Beaufort, M. F.
France, Poitiers
Universite de Poitiers
Barbot, J. F.
France, Poitiers
Universite de Poitiers
Leroy, B.
France, Bois-colombes
Compagnie Ibm France
Statistics
Citations: 24
Authors: 7
Affiliations: 4
Identifiers
Doi:
10.1063/1.372155
ISSN:
00218979
Study Design
Cross Sectional Study