Effect of gamma irradiation on microstructure of the layered Ge0.995Nd0.005S

X-ray analysis of layered Ge0.995Nd0.005S crystal has been investigated before and after gamma irradiation. Single crystal Ge0.995Nd0.005S was irradiated with a 60Co gamma source which had an energy of 1.33 MeV. The dose rate was D = 0.35 Gy/s and the absorption dose was from 1 kGy up to 30 kGy. The thermogravimetric analysis, differential scanning calorimetric, differential thermogravimetric and differential thermal analysis were performed on the samples. The thermodynamic analysis was evaluated for the thermally stable temperature range for unirradiated and irradiated Ge0.995Nd0.005S compound. The results showed the splitting of GeNdS sample in the manner ? GeNd + Ge1-xS at the temperature range of 644?C ≤ T ≤ 675?C which leads to mass reduction by 0.29%.