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CCQM-K55.c key comparison on the characterization of organic substances for chemical purity

Metrologia, Volume 51, No. 1A, Article 08010, Year 2014

Westwood, Steven
1. France, Sevres Bipm Bureau International Des Poids et Mesures
Josephs, Ralf D.
1. France, Sevres Bipm Bureau International Des Poids et Mesures
Choteau, Tiphaine
1. France, Sevres Bipm Bureau International Des Poids et Mesures
Daireaux, Adeline
1. France, Sevres Bipm Bureau International Des Poids et Mesures
Wielgosz, Robert Ian
1. France, Sevres Bipm Bureau International Des Poids et Mesures
Davies, Stephen
1. Australia, Sydney National Measurement Institute, Australia
Moawad, Michael
1. Australia, Sydney National Measurement Institute, Australia
Chan, Benjamin
1. Australia, Sydney National Measurement Institute, Australia
Muñoz, Amalia
1. Belgium, Brussels European Commission Joint Research Centre
Conneely, Patrick
1. Belgium, Brussels European Commission Joint Research Centre
Ricci, Marina
1. Belgium, Brussels European Commission Joint Research Centre
Do Rego, E. C.P.
1. Brazil, Rio de Janeiro Instituto Nacional de Metrologia
Garrido, B. C.
1. Brazil, Rio de Janeiro Instituto Nacional de Metrologia
Violante, Fernando G.M.
1. Brazil, Rio de Janeiro Instituto Nacional de Metrologia
Windust, Anthony
1. Canada, Ottawa National Research Council Canada
Dai, Xinhua
1. China, Beijing National Institute of Metrology China
Huang, Ting
1. China, Beijing National Institute of Metrology China
Zhang, Wei
1. China, Beijing National Institute of Metrology China
Su, Fuhai
1. China, Beijing National Institute of Metrology China
Quan, Can
1. China, Beijing National Institute of Metrology China
Wang, Haifeng
1. China, Beijing National Institute of Metrology China
Lo, Man Fung
1. Hong Kong, Hong Kong The Government of Hong Kong Sar
Wong, Wai Fun
1. Hong Kong, Hong Kong The Government of Hong Kong Sar
Gantois, F.
1. France, Paris Laboratoire National de Metrologie et D'essais
Lalerle, Béatrice
1. France, Paris Laboratoire National de Metrologie et D'essais
Dorgerloh, Ute
1. Germany, Berlin Bundesanstalt Für Materialforschung Und -prüfung
Koch, Matthias
1. Germany, Berlin Bundesanstalt Für Materialforschung Und -prüfung
Klyk-Seitz, Urszula Anna
1. Germany, Berlin Bundesanstalt Für Materialforschung Und -prüfung
Pfeifer, Dietmar
1. Germany, Berlin Bundesanstalt Für Materialforschung Und -prüfung
Philipp, Rosemarie
1. Germany, Berlin Bundesanstalt Für Materialforschung Und -prüfung
Piechotta, Christian
1. Germany, Berlin Bundesanstalt Für Materialforschung Und -prüfung
Recknagel, Sebastian
1. Germany, Berlin Bundesanstalt Für Materialforschung Und -prüfung
Rothe, Robert
1. Germany, Berlin Bundesanstalt Für Materialforschung Und -prüfung
Yamazaki, Taichi
1. Japan, Tsukuba National Metrology Institute of Japan
Bin Zakaria, Osman
1. Malaysia National Metrology Laboratory (sirim)
Castro, E.
1. Mexico, Queretaro Centro Nacional de Metrologia, Mexico
Balderas, M.
1. Mexico, Queretaro Centro Nacional de Metrologia, Mexico
González, N.
1. Mexico, Queretaro Centro Nacional de Metrologia, Mexico
Salazar, C.
1. Mexico, Queretaro Centro Nacional de Metrologia, Mexico
Regalado, L.
1. Mexico, Queretaro Centro Nacional de Metrologia, Mexico
Valle, E.
1. Mexico, Queretaro Centro Nacional de Metrologia, Mexico
Rodríguez, L.
1. Mexico, Queretaro Centro Nacional de Metrologia, Mexico
Ángel Laguna, L.
1. Mexico, Queretaro Centro Nacional de Metrologia, Mexico
Ramírez, P.
1. Mexico, Queretaro Centro Nacional de Metrologia, Mexico
Avila, Marco A.
1. Mexico, Queretaro Centro Nacional de Metrologia, Mexico
Ibarra, J.
1. Mexico, Queretaro Centro Nacional de Metrologia, Mexico
Valle, L.
1. Mexico, Queretaro Centro Nacional de Metrologia, Mexico
Pérez, M.
1. Mexico, Queretaro Centro Nacional de Metrologia, Mexico
Arce, M.
1. Mexico, Queretaro Centro Nacional de Metrologia, Mexico
Mitani, Y.
1. Mexico, Queretaro Centro Nacional de Metrologia, Mexico
Konopelko, Leonid A.
1. Russian Federation, Saint Petersburg D.i. Mendeleyev Institute for Metrology
Krylov, Anatoli I.
1. Russian Federation, Saint Petersburg D.i. Mendeleyev Institute for Metrology
Lopushanskaya, E.
1. Russian Federation, Saint Petersburg D.i. Mendeleyev Institute for Metrology
Lin, Teo Tang
1. Singapore, Singapore City Health Sciences Authority, Government of Singapore
Liu, Qinde
1. Singapore, Singapore City Health Sciences Authority, Government of Singapore
Kooi, Lee Tong
1. Singapore, Singapore City Health Sciences Authority, Government of Singapore
Fernandes-Whaley, Maria
1. South Africa, Pretoria National Metrology Institute of South Africa
Prevoo-Franzsen, Desiree
1. South Africa, Pretoria National Metrology Institute of South Africa
Nhlapo, N.
1. South Africa, Pretoria National Metrology Institute of South Africa
Visser, Ria
1. South Africa, Pretoria National Metrology Institute of South Africa
Kim, Byungjoo
1. South Korea, Yusong Korea Research Institute of Standards and Science
Lee, Hwashim
1. South Korea, Yusong Korea Research Institute of Standards and Science
Kankaew, Pornhatai
1. Thailand, Amphoe Khlong Luang National Institute of Metrology Thailand
Pookrod, Preeyaporn
1. Thailand, Amphoe Khlong Luang National Institute of Metrology Thailand
Sudsiri, Nittaya
1. Thailand, Amphoe Khlong Luang National Institute of Metrology Thailand
Shearman, Kittiya
1. Thailand, Amphoe Khlong Luang National Institute of Metrology Thailand
Gören, Ahmet C.
1. Turkey, Gebze Tübi̇tak Ulusal Metroloji Enstitüsü
Bilsel, Gokhan
1. Turkey, Gebze Tübi̇tak Ulusal Metroloji Enstitüsü
Yilmaz, Hasibe
1. Turkey, Gebze Tübi̇tak Ulusal Metroloji Enstitüsü
Bilsel, Mine
1. Turkey, Gebze Tübi̇tak Ulusal Metroloji Enstitüsü
Çergel, Muhiddin
1. Turkey, Gebze Tübi̇tak Ulusal Metroloji Enstitüsü
Çoşkun, Fatma Gonca
1. Turkey, Gebze Tübi̇tak Ulusal Metroloji Enstitüsü
Uysal, Emrah
1. Turkey, Gebze Tübi̇tak Ulusal Metroloji Enstitüsü
Gündüz, Simay
1. Turkey, Gebze Tübi̇tak Ulusal Metroloji Enstitüsü
Un, Ilker
1. Turkey, Gebze Tübi̇tak Ulusal Metroloji Enstitüsü
Warren, John
1. United Kingdom, Teddington Lgc Ltd.
Bearden, Daniel W.
1. United States, Gaithersburg National Institute of Standards and Technology
Bedner, Mary
1. United States, Gaithersburg National Institute of Standards and Technology
Duewer, David L.
1. United States, Gaithersburg National Institute of Standards and Technology
Lang, Brian E.
1. United States, Gaithersburg National Institute of Standards and Technology
Lippa, Katrice A.
1. United States, Gaithersburg National Institute of Standards and Technology
Schantz, Michele
1. United States, Gaithersburg National Institute of Standards and Technology
Sieber, John R.
1. United States, Gaithersburg National Institute of Standards and Technology

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CCQM-K55.c key comparison on the characterization of organic substances for chemical purity

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AFRICAN RESEARCH NEXUS

CCQM-K55.c key comparison on the characterization of organic substances for chemical purity

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