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Publication Details
AFRICAN RESEARCH NEXUS
SHINING A SPOTLIGHT ON AFRICAN RESEARCH
chemistry
Intrinsic wavelength standard absorption bands in holmium oxide solution for UV/visible molecular absorption spectrophotometry
Journal of Physical and Chemical Reference Data, Volume 34, No. 1, Year 2005
Notification
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Description
The transmittance minima of 18 absorption bands of a solution of 40 g/L holmium oxide in 10% (volume fraction) perchloric acid are certified as intrinsic traceable wavelength standards, by means of a multicenter measurement on material from a single source coupled with comparisons of a variety of preparations of the material evaluated on a single instrument. Fit-for-purpose artifact standards for the experimental calibration or validation of wavelength scales of chemical spectrophotometers can be carefully produced by end users themselves or by commercial standards producers. The intrinsic (data) standard confers traceability to the SI unit of length in place of costly transfer artifacts and repetitive calibration procedures. Certified values are provided for instrumental spectral bandwidths of 0.1-3.0 nm in 0.1 nm intervals, and information values are provided to a spectral bandwidth of 10 nm at wider intervals. Expanded uncertainties are typically less than ±0.1nm for certified band positions. © 2005 by the U.S. Secretary of Commerce on behalf of the United States. All rights reserved.
Authors & Co-Authors
Travis, John C.
United States, Gaithersburg
National Institute of Standards and Technology
Campos, J.
Spain, Madrid
Csic - Instituto de Física Aplicada Ifa
Andor, György
Hungary, Budapest
Alapmérések I. Foosztály
Bastié, Jean
France, Paris
Conservatoire National Des Arts et Metiers
Blattner, Peter
Switzerland, Wabern
Swiss Federal Office of Metrology
Chunnilall, Christopher J.
United Kingdom, Middlesex
National Physical Laboratory
Crosson, Steven C.
United States, Gaithersburg
National Institute of Standards and Technology
Duewer, David L.
United States, Gaithersburg
National Institute of Standards and Technology
Early, Edward A.
United States, Gaithersburg
National Institute of Standards and Technology
Hengstberger, Franz
South Africa, Pretoria
Csir-national Metrology Laboratory
Kim, Chang Soon
South Korea, Yusong
Korea Research Institute of Standards and Science
Liedquist, Leif
Sweden, Boras
Rise, sp Technical Research Institute of Sweden
Manoocheri, Farshid
Finland, Espoo
Aalto University
Mercader, Flora
Mexico, Queretaro
Centro Nacional de Metrologia, Mexico
Monard, L. A.G.
South Africa, Pretoria
Csir-national Metrology Laboratory
Nevas, Saulius
Finland, Espoo
Aalto University
Mito, Akihiro
Japan, Tsukuba
National Metrology Institute of Japan
Nilsson, Morgan
Sweden, Stockholm
Karolinska Universitetssjukhuset
Noël, Mario
Canada, Ottawa
National Research Council Canada
Rodriguez, Antonio Corróns
Spain, Madrid
Csic - Instituto de Física Aplicada Ifa
Ruíz, Arquímedes
Mexico, Queretaro
Centro Nacional de Metrologia, Mexico
Schirmacher, Alfred
Germany, Braunschweig
Physikalisch-technische Bundesanstalt
Smith, Melody V.
United States, Gaithersburg
National Institute of Standards and Technology
Valencia, Guillermo
Mexico, Queretaro
Centro Nacional de Metrologia, Mexico
Van Tonder, Natasha
South Africa, Pretoria
Csir-national Metrology Laboratory
Zwinkels, Joanne
Canada, Ottawa
National Research Council Canada
Statistics
Citations: 26
Authors: 26
Affiliations: 15
Identifiers
Doi:
10.1063/1.1835331
ISSN:
00472689