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Publication Details
AFRICAN RESEARCH NEXUS
SHINING A SPOTLIGHT ON AFRICAN RESEARCH
physics and astronomy
Future analytical needs for industry and technology
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Volume 136-138, Year 1998
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Description
This paper summarizes reports and opinions presented during a Roundtable Session of the same title at the 13th International Conference on Ion Beam Analysis, Lisbon, 1997. The evolution of new technologies and new fields of research is creating new demands for advanced materials analysis, often at a level not attainable with current techniques. We therefore explore some opportunities for creative development of new or enhanced ion beam techniques to satisfy major predictable needs of the future. In particular, new analytical applications are discussed for the semiconductor industry, for biomedical research, and for advanced research in minerals and geoscience. © 1998 Elsevier Science B.V.
Authors & Co-Authors
Baglin, John E.E.
United States, San Jose
Ibm Research - Almaden
Séamus Davis, J. C.
United States, Livermore
Lawrence Livermore National Laboratory
Gabella, Patricia
United States, Austin
Sematech Austin
Prozesky, Victor M.
South Africa, Faure
National Accelerator Centre
Sie, Soey H.
Australia, Brisbane
Csiro Exploration and Mining
Statistics
Citations: 5
Authors: 5
Affiliations: 5
Identifiers
Doi:
10.1016/S0168-583X(97)00832-X
ISSN:
0168583X