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Publication Details
AFRICAN RESEARCH NEXUS
SHINING A SPOTLIGHT ON AFRICAN RESEARCH
chemical engineering
Ultrasensitive detection of force and displacement using trapped ions
Nature Nanotechnology, Volume 5, No. 9, Year 2010
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Description
The ability to detect extremely small forces and nanoscale displacements is vital for disciplines such as precision spin-resonance imaging, microscopy, and tests of fundamental physical phenomena. Current force-detection sensitivity limits have surpassed 1aN Hz -1/2 (refs 6,7) through coupling of nanomechanical resonators to a variety of physical readout systems 1,7-10. Here, we demonstrate that crystals of trapped atomic ions11,12 behave as nanoscale mechanical oscillators and may form the core of exquisitely sensitive force and displacement detectors. We report the detection of forces with a sensitivity of 390±150 yN Hz -1/2, which is more than three orders of magnitude better than existing reports using nanofabricated devices 7, and discriminate ion displacements of μ18 nm. Our technique is based on the excitation of tunable normal motional modes in an ion trap and detection through phase-coherent Doppler velocimetry, and should ultimately allow force detection with a sensitivity better than 1 yN Hz -1/2 (ref. 16). Trapped-ion-based sensors could enable scientists to explore new regimes in materials science where augmented force, field and displacement sensitivity may be traded against reduced spatial resolution. © 2010 Macmillan Publishers Limited. All rights reserved.
Authors & Co-Authors
Biercuk, Michael J.
United States, Gaithersburg
National Institute of Standards and Technology
Australia, Sydney
The University of Sydney
Uys, Hermann
United States, Gaithersburg
National Institute of Standards and Technology
South Africa, Pretoria
The Council for Scientific and Industrial Research
Britton, Joseph W.
United States, Gaithersburg
National Institute of Standards and Technology
VanDevender, Aaron P.
United States, Gaithersburg
National Institute of Standards and Technology
Bollinger, John J.
United States, Gaithersburg
National Institute of Standards and Technology
Statistics
Citations: 105
Authors: 5
Affiliations: 3
Identifiers
Doi:
10.1038/nnano.2010.165
ISSN:
17483387
e-ISSN:
17483395