Skip to content
Home
About Us
Resources
Profiles Metrics
Authors Directory
Institutions Directory
Top Authors
Top Institutions
Top Sponsors
AI Digest
Contact Us
Menu
Home
About Us
Resources
Profiles Metrics
Authors Directory
Institutions Directory
Top Authors
Top Institutions
Top Sponsors
AI Digest
Contact Us
Home
About Us
Resources
Profiles Metrics
Authors Directory
Institutions Directory
Top Authors
Top Institutions
Top Sponsors
AI Digest
Contact Us
Menu
Home
About Us
Resources
Profiles Metrics
Authors Directory
Institutions Directory
Top Authors
Top Institutions
Top Sponsors
AI Digest
Contact Us
Publication Details
AFRICAN RESEARCH NEXUS
SHINING A SPOTLIGHT ON AFRICAN RESEARCH
chemistry
TiO
2
thin films prepared by sol-gel method for waveguiding applications: Correlation between the structural and optical properties
Optical Materials, Volume 30, No. 4, Year 2007
Notification
URL copied to clipboard!
Description
Thin films of transparent titanium oxide (TiO2) are prepared by the sol-gel dip-coating technique. Structural and optical properties of TiO2 thin films are investigated for different annealing temperatures and different number of coatings. X-ray diffraction (XRD) and Raman spectroscopy analysis show that the anatase crystalline phase appears beyond 350 °C for the four layers TiO2 film. At higher temperatures and for thicker films, we observe in addition to anatase the formation of brookite and rutile phases. The grain size calculated from XRD patterns increases as the temperature of annealing and number of dipping increase, from 11.9 to 17.1 nm for anatase and decreases as the number of dipping increases, from 24.2 to 10.2 nm for brookite. Film thickness, refractive index, and porosity are found to vary with treatment temperature and the number of coating. The obtained films are transparent in the visible range and opaque in the UV region. Waveguiding properties are studied using m-lines spectroscopy. The best results indicate that our films are monomodes TE0 at 632.8 nm with optical losses of 2 dB cm-1. © 2007 Elsevier B.V. All rights reserved.
Authors & Co-Authors
Mechiakh, Raouf
Algeria, Constantine
Université Constantine 1
Meriche, F.
France, Metz
Laboratoire Matériaux Optiques, Photonique et Systèmes
Kremer, Régis
France, Metz
Laboratoire Matériaux Optiques, Photonique et Systèmes
Bensaha, Rabah
Algeria, Constantine
Université Constantine 1
Boudine, Boubekeur
Algeria, Constantine
Université Constantine 1
Boudrioua, A.
France, Metz
Laboratoire Matériaux Optiques, Photonique et Systèmes
Statistics
Citations: 105
Authors: 6
Affiliations: 2
Identifiers
Doi:
10.1016/j.optmat.2007.02.047
ISSN:
09253467