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Publication Details
AFRICAN RESEARCH NEXUS
SHINING A SPOTLIGHT ON AFRICAN RESEARCH
engineering
Effects of DUT mismatch on the noise figure characterization: A comparative analysis of two Y-factor techniques
IEEE Transactions on Instrumentation and Measurement, Volume 51, No. 6, Year 2002
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Description
Device mismatch seriously degrades accuracy in noise figure characterization. The suitability of corrections to the gain definitions for a more precise noise figure evaluation for mismatched devices is investigated and compared to classical techniques. The effects of device mismatch on the noise figure of the noise-meter receiver and its impact on the final accuracy are analyzed. © 2002 IEEE.
Authors & Co-Authors
Collantes, Juan Mari
United States, New York
Ieee
Spain, Leioa
Universidad Del Pais Vasco
Pollard, Roger D.
United States, New York
Ieee
United Kingdom, Leeds
University of Leeds
United Kingdom, Stockport
Agilent Technologies Lda uk Limited
Unknown
Institute of Microwaves and Photonics
United States, Santa Clara
Agilent Technologies
United Kingdom, Stevenage
Institution of Electrical Engineers
Unknown
Services and Products Board (pspb)
Sayed, Mohamed
United States, New York
Ieee
United States, Santa Clara
Agilent Technologies
Unknown
Microwave Vector Network
Egypt, Giza
Cairo University
United States, San Jose
San Jose State University
Statistics
Citations: 47
Authors: 3
Affiliations: 11
Identifiers
Doi:
10.1109/TIM.2002.808015
ISSN:
00189456